Optical Characteristic Inspection System "Swept Test System"
High-speed, high-precision, and high-resolution evaluation of IL/WDL/PDL is possible!
The Swept Test System, which combines a wavelength-tunable light source (TSL series), a multi-port power meter (MPM series), a polarization control unit (PCU-110), and dedicated software, serves as an optimal evaluation tool for both research and development of optical devices and production environments. By referencing the output power from the wavelength-tunable light source in real-time and simultaneously acquiring the optical power transmitted through the DUT, high-precision measurements of IL/WDL/PDL can be achieved. This system calculates PDL using the Mueller matrix method. ■ Features - Rescaling algorithm (high resolution 0.1 pm) - Real-time power reference (reproducibility 0.02 dB) - High-precision wavelength monitor built into the light source (absolute wavelength accuracy 3 pm)
- Company：Santec Holdings Corporation
- Price：Other
